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JEOL Scanning Electron Microscope System will cost about USD 350,000/- with all the options when new. i) Complete Jeol Low Vacuum SEM unit with Manuals come with following feature : - Backscattered Electron Detector MP-94070 (BEIW) - Fully auto 5 axis specimen stage - Special 8 Chamber for large specimen (Standard size is 6) i) Oxford EDS (INCA Energy X-Ray Microanalysis system, 230V 50Hz operation) - Detector : Pentafer Plus Si(Li), 138eV resolution, with 10mm2 Super ATW window and 7.5L LN2 dewar). - Software : Quantitative analysis, Beam automation, SmartMap features and INCA Automatic Particle analysis software (Cost S$44,200). ii) ETP Semra Chamber view (Robinson) system i) Element characterize all type of material (EDS) ii) Automatic Analyzes particle sizes, type and quantity (Oxford software) iii) Chamber View – view the sample inside the chamber (Additional safety features) iv) Capable to handle 8 sample size (or 8 wafer) III. Power down and De-installation a) Jeol SEM – Carried out by Jeol Asia Singapore service team after completed functional check. b) EDS – Carried out by Oxford Instrument, Singapore service team after completed functional check |
