Agilent / hp 4156B semiconductor parameter analyzer

UpUp


Subject: Agilent / hp 4156B semiconductor parameter analyzer
Agilent / HP 4156B Semiconductor Parameter Analyzer
The Agilent / HP 4156B is the next generation in precision semiconductor parameter analyzers. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument. This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis. HP 4156B has four highly accurate source/monitor units, two voltage source units, and two voltage measurement units. It is designed for Kelvin connections and has high-resolution SMUs, so it is especially suited for low resistance and low current measurements.
* High-resolution/accuracy and wide range. I: 1
* fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
* Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
* Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
* Tme-domain measurement: 60µs–variable intervals, up to 10,001 points
* Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
* Automation: built-in HP Instrument BASIC, trigger I/O capability
* Four HP 04155-61602 Kelvin Triaxial Cables(3m)
* One Application Disk, P/N 04155-18003 Rev. A.01.30
* One HP VEE Sample Program Disk, P/N 04155-18401 Rev. A.01.00
* Sample Application Programs Guide Book
* HP Instrument BASIC Manuals
* Our hours of operation are M-F, 10-5PM Pacific Standard Time.
Phone: Fax: