Nanometrics aft-210 automatic film thickness measuremt.

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Subject: Nanometrics aft-210 automatic film thickness measuremt.
"AUTOMATIC FILM THICKNESS MEASUREMENT SYSTEM (S/N-5684). WITH OBJECTIVE LENSES [ULWD-MSPLAN 50X AND MSPLAN 5X/10X] ; NANOMETRICS COMPUTER/POWER CONSOLE ; PC TOWER COMPUTER SYSTEM. [NOTE: DOES NOT INCLUDE THE KINETICS VIBRAPLANE PLATFORM].